Pulsed-laser induced single-event transients in InGaAs FinFETs on bulk silicon substrates

Gong, H.; Ni, K.; Zhang, E.X.; Sternberg, A. L.; Kuzub, J.A.; Alles, M.L.; Reed, R.; Fleetwood, D.; Schrimpf, R.; Waldron, Niamh; Kunert, Bernardette; Linten, Dimitri

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Pulsed-laser induced single-event transients in InGaAs FinFETs on bulk silicon substrates

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2019

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IEEE Transactions on Nuclear Science

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2009 since deposited on 2021-10-27

Acq. date: 2026-02-24

Pulsed-laser induced single-event transients in InGaAs FinFETs on bulk silicon substrates

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