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High-performance Monolayer-2D Stacked Nanosheet FETs with high I<sub>ON</sub> ∼ 451 μA/μm and I<sub>ON</sub>/I<sub>OFF</sub> &gt; 10<SUP>9</SUP>

 
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dc.contributor.authorXi, Fengben
dc.contributor.authorSharma, Himanshu
dc.contributor.authorWu, Xiangyu
dc.contributor.authorVerreck, Devin
dc.contributor.authorCott, Daire
dc.contributor.authorGrubbs, Robert K.
dc.contributor.authorNgo, Tien Dat
dc.contributor.authorKumar, Pawan
dc.contributor.authorMorin, Pierre
dc.contributor.authorGroven, Benjamin
dc.contributor.authorde Marneffe, Jean-Francois
dc.contributor.authorvan Dorp, Dennis
dc.contributor.authorGhosh, Souvik
dc.contributor.authorLin, Zaoyang
dc.contributor.authorNalin Mehta, Ankit
dc.contributor.authorChen, Zhuo
dc.contributor.authorSutar, Surajit
dc.contributor.authorSchram, Tom
dc.contributor.authorSmets, Quentin
dc.contributor.authorLin, Dennis
dc.date.accessioned2026-07-07T10:34:17Z
dc.date.available2026-07-07T10:34:17Z
dc.date.createdwos2026-03-18
dc.date.issued2024
dc.description.abstractIn this work, stacked nanosheet FETs with monolayer MoS2 channels are presented. At a channel length of 40 nm, the transistor exhibits a remarkable ION−451 μA/μm at VDS=1 V, achieved with two tiers of monolayer-MoS2 channels. The device has a record ION/IOFF>109 and a yield of 96.59%, which shows good electro-static control in the nanosheet channels. We compare these results to dual gate 2D FETs and show how learnings on the planar devices can be utilized in a gate-all-around case. The successful demonstration of stacked 2D nanosheet FETs with high performance further extends Moore's Law scaling with the future 2D CFETs application.
dc.description.wosFundingTextWe acknowledge the contributions of the Mice pilot line, Lam research, imec Xplore Lab, and AMSIMEC teams, in particular, Bavo Storms and Rudy Verheyen, Marta Agati and Chris DriThooms, Han Han, Olivier Richard and Jef Geypen for their assistance. This research was funded by the imec IIAP core CMOS programs.
dc.identifier.doi10.1109/iedm50854.2024.10873412
dc.identifier.issn2380-9248
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/59763
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedate2024-12-07
dc.source.conferencelocationSan Francisco
dc.source.journal2024 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, IEDM
dc.source.numberofpages4
dc.title

High-performance Monolayer-2D Stacked Nanosheet FETs with high ION ∼ 451 μA/μm and ION/IOFF > 109

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2026-04-07
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-04-07
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