Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors
Publication:
A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors
Copy permalink
Date
2019
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hsu, Brent
;
Simoen, Eddy
;
Lin, Dennis
;
Stesmans, Andre
;
Goux, Ludovic
;
Delhougne, Romain
;
Kar, Gouri Sankar
Journal
Abstract
Description
Statistics
Views
2021
since deposited on 2021-10-27
2
last month
1
last week
Acq. date: 2026-02-24
Citations
Statistics
Views
2021
since deposited on 2021-10-27
2
last month
1
last week
Acq. date: 2026-02-24
Citations