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Probing semiconductor technology and devices with scanning spreading resistance microscopy
Publication:
Probing semiconductor technology and devices with scanning spreading resistance microscopy
Date
2007
Book Chapter
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eyben, Pierre
;
Vandervorst, Wilfried
;
Alvarez, David
;
Xu, Mingwei
;
Fouchier, Marc
Journal
Abstract
Description
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Views
1991
since deposited on 2021-10-16
435
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1991
since deposited on 2021-10-16
435
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations