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Resist fundamentals for resolution, LER and sensitivity (RLS) performance tradeoffs and their relation to micro-bridging defects
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Resist fundamentals for resolution, LER and sensitivity (RLS) performance tradeoffs and their relation to micro-bridging defects
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Date
2009
Proceedings Paper
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17920.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rathsack, Benjamin
;
Nafus, Kathleen
;
Hatakeyama, Shinichi
;
Kuwahara, Yuhei
;
Kitano, Junichi
;
Gronheid, Roel
;
Vaglio Pret, Alessandro
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1933
since deposited on 2021-10-18
Acq. date: 2025-12-11
Citations
Metrics
Views
1933
since deposited on 2021-10-18
Acq. date: 2025-12-11
Citations