Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

Michl, Jakob; Grill, Alexander; Waldhoer, Dominic; Goes, Wolfgang; Kaczer, Ben; Linten, Dimitri; Parvais, Bertrand; Govoreanu, Bogdan; Radu, Iuliana; Waltl, Michael; Grasser, Tibor

doi:10.1109/ted.2021.3116931

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Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

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2021

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https://doi.org/10.1109/ted.2021.3116931

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IEEE TRANSACTIONS ON ELECTRON DEVICES

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Acq. date: 2026-08-07

Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

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