Publication:

Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

Date

2021
Journal article
https://doi.org/10.1109/TED.2021.3116931
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dc.contributor.authorMichl, Jakob
dc.contributor.authorGrill, Alexander
dc.contributor.authorWaldhoer, Dominic
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorKaczer, Ben
dc.contributor.authorLinten, Dimitri
dc.contributor.authorParvais, Bertrand
dc.contributor.authorGovoreanu, Bogdan
dc.contributor.authorRadu, Iuliana
dc.contributor.authorWaltl, Michael
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorGrill, Alexander
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorGovoreanu, Bogdan
dc.contributor.imecauthorRadu, Iuliana
dc.contributor.orcidimecGrill, Alexander::0000-0003-1615-1033
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecRadu, Iuliana::0000-0002-7230-7218
dc.date.accessioned2022-06-23T14:41:52Z
dc.date.available2021-12-16T02:05:47Z
dc.date.available2022-05-30T09:17:55Z
dc.date.available2022-06-23T14:41:52Z
dc.date.embargo9999-12-31
dc.date.issued2021
dc.identifier.doi10.1109/TED.2021.3116931
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38619
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage6365
dc.source.endpage6371
dc.source.issue12
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages7
dc.source.volume68
dc.title

Efficient Modeling of Charge Trapping at Cryogenic Temperatures-Part I: Theory

dc.typeJournal article
dspace.entity.typePublication
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