Publication:
Reliability of high mobility (si)Ge channel pMOSFETs for future CMOS applications: toward reliable ultra-thin EOT nanoscale transistors
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Downloads
2 since deposited on 2021-10-21
Acq. date: 2025-12-16
Views
1884 since deposited on 2021-10-21
Acq. date: 2025-12-16
Citations
Metrics
Downloads
2 since deposited on 2021-10-21
Acq. date: 2025-12-16
Views
1884 since deposited on 2021-10-21
Acq. date: 2025-12-16
Citations