Publication:

Understanding endurance in TiN/a-Si/TiOx/TiN RRAM devices

Date

2018

Proceedings Paper

Simple item page Full metadata Statistics

Files

38083.pdf 2.27 MB

Author(s)

Subhechha, Subhali

;

Degraeve, Robin

;

Belmonte, Attilio

;

;

Roussel, Philippe

;

De Meyer, Kristin

;

;

Kar, Gouri Sankar

Metrics

1925 since deposited on 2021-10-26

Acq. date: 2025-12-15