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The impact of the S/D extensions on the drain current characteristics of deep submicron Si nMOSFETs at 77K
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The impact of the S/D extensions on the drain current characteristics of deep submicron Si nMOSFETs at 77K
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Date
1997
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Biesemans, Serge
;
Simoen, Eddy
;
Kubicek, Stefan
;
De Meyer, Kristin
;
Claeys, Cor
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1850
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-15
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Metrics
Views
1850
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-15
Citations