The impact of the S/D extensions on the drain current characteristics of deep submicron Si nMOSFETs at 77K

dc.contributor.author	Biesemans, Serge
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Kubicek, Stefan
dc.contributor.author	De Meyer, Kristin
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Biesemans, Serge
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.imecauthor	Kubicek, Stefan
dc.contributor.imecauthor	De Meyer, Kristin
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-09-30T07:57:19Z
dc.date.available	2021-09-30T07:57:19Z
dc.date.embargo	9999-12-31
dc.date.issued	1997
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/1741
dc.source.beginpage	564
dc.source.conference	ESSDERC '97: Proceedings of the 27th European Solid-State Device Research Conference
dc.source.conferencedate	22/09/1997
dc.source.conferencelocation	Stuttgart Germany
dc.source.endpage	567
dc.title	The impact of the S/D extensions on the drain current characteristics of deep submicron Si nMOSFETs at 77K
dc.type	Proceedings paper
dspace.entity.type	Publication
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