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ARIBA: a combined analysis set-up for high resolution RBS and TOF-ERDA for thin film analysis
Publication:
ARIBA: a combined analysis set-up for high resolution RBS and TOF-ERDA for thin film analysis
Date
2004
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sajavaara, Timo
;
Brijs, Bert
;
Giangrandi, Simone
;
Arstila, Kai
;
Vantomme, Andre
;
Vandervorst, Wilfried
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2076
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
2076
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations