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Articles
Ge1-xSnx stressors for strained-Ge CMOS
Publication:
Ge1-xSnx stressors for strained-Ge CMOS
Date
2011
Journal article
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21656.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Takeuchi, Shotaro
;
Shimura, Yosuke
;
Nishimura, T.
;
Vincent, Benjamin
;
Eneman, Geert
;
Clarysse, Trudo
;
Demeulemeester, Jelle
;
Vantomme, Andre
;
Dekoster, Johan
;
Caymax, Matty
;
Loo, Roger
;
Sakai, A.
;
Nakatsuka, Osaku
;
Zaima, Shigeaki
Journal
Solid-State Electronics
Abstract
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1937
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations
Metrics
Views
1937
since deposited on 2021-10-19
Acq. date: 2025-10-23
Citations