Publication:

Ge1-xSnx stressors for strained-Ge CMOS

Date

2011
Journal article
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dc.contributor.authorTakeuchi, Shotaro
dc.contributor.authorShimura, Yosuke
dc.contributor.authorNishimura, T.
dc.contributor.authorVincent, Benjamin
dc.contributor.authorEneman, Geert
dc.contributor.authorClarysse, Trudo
dc.contributor.authorDemeulemeester, Jelle
dc.contributor.authorVantomme, Andre
dc.contributor.authorDekoster, Johan
dc.contributor.authorCaymax, Matty
dc.contributor.authorLoo, Roger
dc.contributor.authorSakai, A.
dc.contributor.authorNakatsuka, Osaku
dc.contributor.authorZaima, Shigeaki
dc.contributor.imecauthorVincent, Benjamin
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorDekoster, Johan
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorLoo, Roger
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.accessioned2021-10-19T19:27:11Z
dc.date.available2021-10-19T19:27:11Z
dc.date.embargo9999-12-31
dc.date.issued2011
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19860
dc.source.beginpage53
dc.source.endpage57
dc.source.issue1
dc.source.journalSolid-State Electronics
dc.source.volume60
dc.title

Ge1-xSnx stressors for strained-Ge CMOS

dc.typeJournal article
dspace.entity.typePublication
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