Publication:

On the characterization of the strain field of lattice defects in silicon with nanometer resolution

Date

1994

Proceedings Paper

Simple item page Full metadata Statistics

Author(s)

Janssens, Koenraad

;

Van der Biest, O.

;

Vanhellemont, Jan

;

Statistics

2080 since deposited on 2021-09-29

3last month

Acq. date: 2026-04-27