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Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster
Publication:
Evaluation of interferometric ellipsometer systems with a time resolution of one microsecond and faster
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Date
1998
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Hemmes, K.
;
Hamstra, M. A.
;
Koops, K. R.
;
Wind, M. M.
;
Schram, Tom
;
De Laet, Jan
;
Bender, Hugo
Journal
Thin Solid Films
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1848
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Acq. date: 2025-12-18
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Metrics
Views
1848
since deposited on 2021-09-30
1
last month
Acq. date: 2025-12-18
Citations