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Strain characterization and simulation for MOSFETs with embedded source/drain stressors
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Strain characterization and simulation for MOSFETs with embedded source/drain stressors
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Date
2014-04
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Eneman, Geert
;
Favia, Paola
;
Bender, Hugo
;
Verheyen, Peter
;
Vincent, Benjamin
;
Hikavyy, Andriy
;
Loo, Roger
;
Claeys, Cor
;
Buhler, Rudolf
;
Martino, Joao
;
Bargallo Gonzalez, Mireia
;
Thean, Aaron
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1860
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Acq. date: 2025-12-15
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Metrics
Views
1860
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-15
Citations