Publication:

Modeling the Operation of Charge Trap Flash Memory-Part II: Understanding the ISPP Curve With a Semianalytical Model

Date

2024
Journal article
https://doi.org/10.1109/TED.2023.3339112
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Author(s)

Verreck, Devin  
;
Schanovsky, Franz
;
Arreghini, Antonio  
;
Van den Bosch, Geert  
;
Stanojevic, Zlatan
;
Karner, Markus
;
Rosmeulen, Maarten  

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES

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366 since deposited on 2023-12-30
55last month
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Acq. date: 2026-04-26

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922 since deposited on 2023-12-30
6last month
1last week
Acq. date: 2026-04-26

Citations