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Modeling the Operation of Charge Trap Flash Memory-Part II: Understanding the ISPP Curve With a Semianalytical Model
Publication:
Modeling the Operation of Charge Trap Flash Memory-Part II: Understanding the ISPP Curve With a Semianalytical Model
Date
2024
Journal article
https://doi.org/10.1109/TED.2023.3339112
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verreck, Devin
;
Schanovsky, Franz
;
Arreghini, Antonio
;
Van den Bosch, Geert
;
Stanojevic, Zlatan
;
Karner, Markus
;
Rosmeulen, Maarten
Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
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Downloads
112
since deposited on 2023-12-30
51
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Views
911
since deposited on 2023-12-30
394
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations