Publication:

Modeling the Operation of Charge Trap Flash Memory-Part II: Understanding the ISPP Curve With a Semianalytical Model

Date

2024
Journal article
https://doi.org/10.1109/TED.2023.3339112
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dc.contributor.authorVerreck, Devin
dc.contributor.authorSchanovsky, Franz
dc.contributor.authorArreghini, Antonio
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorStanojevic, Zlatan
dc.contributor.authorKarner, Markus
dc.contributor.authorRosmeulen, Maarten
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.date.accessioned2024-01-24T11:31:09Z
dc.date.available2023-12-30T17:21:15Z
dc.date.available2024-01-24T11:31:09Z
dc.date.embargo2023-12-08
dc.date.issued2024
dc.description.wosFundingTextThis work was supported by imec's Industrial Affiliation Program for Storage Memory.
dc.identifier.doi10.1109/TED.2023.3339112
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/43327
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage554
dc.source.endpage559
dc.source.issue1
dc.source.journalIEEE TRANSACTIONS ON ELECTRON DEVICES
dc.source.numberofpages6
dc.source.volume71
dc.title

Modeling the Operation of Charge Trap Flash Memory-Part II: Understanding the ISPP Curve With a Semianalytical Model

dc.typeJournal article
dspace.entity.typePublication
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