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Articles
Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications
Publication:
Extensive Electrical Characterization Methodology of Advanced MOSFETs Towards Analog and RF Applications
Date
2021
Journal article
https://doi.org/10.1109/JEDS.2021.3057798
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Kilchytska, Valeriya
;
Makovejev, Sergej
;
Nyssens, Lucas
;
Halder, Arka
;
Raskin, Jean-Pierre
;
Flandre, Denis
;
Kazemi Esfeh, Babak
Journal
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
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2015
since deposited on 2021-11-02
Acq. date: 2025-10-25
Citations
Metrics
Views
2015
since deposited on 2021-11-02
Acq. date: 2025-10-25
Citations