Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Specifics of cross-section analyses on semiconductor multi-layers
Publication:
Specifics of cross-section analyses on semiconductor multi-layers
Copy permalink
Date
2010
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koelling, Sebastian
;
Gilbert, Matthieu
;
Innocenti, Nicolas
;
Kambham, Ajay Kumar
;
Vandervorst, Wilfried
Journal
Abstract
Description
Metrics
Views
1835
since deposited on 2021-10-18
Acq. date: 2026-01-10
Citations
Metrics
Views
1835
since deposited on 2021-10-18
Acq. date: 2026-01-10
Citations