Publication:

High performance Si.45Ge.55 implant free quantum well FET featuring low temperature process, eSiGe stressor and transversal strain relaxation

Date

Loading...
Thumbnail Image

Abstract

Description

Metrics

Views

1886 since deposited on 2021-10-19
Acq. date: 2025-10-23

Citations

Metrics

Views

1886 since deposited on 2021-10-19
Acq. date: 2025-10-23

Citations