Publication:
Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress
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1764 since deposited on 2021-11-02
1last month
Acq. date: 2026-01-26
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Statistics
Views
1764 since deposited on 2021-11-02
1last month
Acq. date: 2026-01-26
Citations