Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress

dc.contributor.author	Chang, Hao
dc.contributor.author	Zhou, Longda
dc.contributor.author	Yang, Hong
dc.contributor.author	Ji, Zhigang
dc.contributor.author	Liu, Qianqian
dc.contributor.author	Xu, Hao
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Yin, Huaxiang
dc.contributor.author	Wang, Wenwu
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2022-01-25T11:37:19Z
dc.date.available	2021-11-02T16:02:29Z
dc.date.available	2022-01-25T11:37:19Z
dc.date.issued	2020
dc.identifier.eisbn	*****************
dc.identifier.issn	1946-1550
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/37991
dc.publisher	IEEE
dc.source.conference	IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
dc.source.conferencedate	JUL 20-23, 2020
dc.source.conferencelocation	Singapore
dc.source.journal	na
dc.source.numberofpages	4
dc.title	Degradation Mechanism of Short Channel p-FinFETs under Hot Carrier Stress and Constant Voltage Stress
dc.type	Proceedings paper
dspace.entity.type	Publication
Files
Publication available in collections:	Conference contributions

Date