Publication:

Low-frequency noise in strained and relaxed Ge pMOSFETs

Date

2010
Proceedings Paper
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Author(s)

Simoen, Eddy  
;
Mitard, Jerome  
;
De Jaeger, Brice  
;
Eneman, Geert  
;
Dobbie, A.
;
Myronov, M.
;
Leadley, D.R.
;
Meuris, Marc  
;
Hoffmann, Thomas Y.
;
Claeys, Cor

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1911 since deposited on 2021-10-18
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Acq. date: 2025-12-11

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