Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs
Publication:
Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs
Copy permalink
Date
2013-09
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Deutsch, Sergej
;
Chakrabarty, Krishnendu
;
Marinissen, Erik Jan
Journal
Abstract
Description
Metrics
Views
1955
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-13
Citations
Metrics
Views
1955
since deposited on 2021-10-21
2
last month
Acq. date: 2025-12-13
Citations