Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Presentations
Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide
Publication:
Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide
Date
2016
Presentation
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
de Jamblinne de Meux, Albert
;
Pourtois, Geoffrey
;
Genoe, Jan
;
Heremans, Paul
Journal
Abstract
Description
Metrics
Views
1911
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1911
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations