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Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide

Date

2016
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dc.contributor.authorde Jamblinne de Meux, Albert
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorGenoe, Jan
dc.contributor.authorHeremans, Paul
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorGenoe, Jan
dc.contributor.imecauthorHeremans, Paul
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecGenoe, Jan::0000-0002-4019-5979
dc.contributor.orcidimecHeremans, Paul::0000-0003-2151-1718
dc.date.accessioned2021-10-23T10:25:57Z
dc.date.available2021-10-23T10:25:57Z
dc.date.issued2016
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26498
dc.identifier.urlhttp://www.european-mrs.com/2016-spring-symposium-n-european-materials-research-society#sthash.zxRaz9Ys.dpuf
dc.source.conferenceE-MRS Sping Meeting
dc.source.conferencedate2/05/2016
dc.source.conferencelocationLille France
dc.title

Reevaluation of the origin of negative bias stress with and without light exposition in amorphous Indium-Gallium-Zinc-Oxide

dc.typeOral presentation
dspace.entity.typePublication
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