Publication:

Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment

Date

2020
Journal article
https://doi.org/10.1109/TEMC.2020.2980790
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Author(s)

De Ridder, Simon  
;
Spina, Domenico  
;
Toscani, Nicola
;
Grassi, Flavia
;
Vande Ginste, Dries  
;
Dhaene, Tom  

Journal

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY

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177 since deposited on 2021-11-02
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1929 since deposited on 2021-11-02
Acq. date: 2026-02-26

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