Publication:

Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment

Date

2020
Journal article
https://doi.org/10.1109/TEMC.2020.2980790
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dc.contributor.authorDe Ridder, Simon
dc.contributor.authorSpina, Domenico
dc.contributor.authorToscani, Nicola
dc.contributor.authorGrassi, Flavia
dc.contributor.authorVande Ginste, Dries
dc.contributor.authorDhaene, Tom
dc.contributor.imecauthorDe Ridder, Simon
dc.contributor.imecauthorSpina, Domenico
dc.contributor.imecauthorVande Ginste, Dries
dc.contributor.imecauthorDhaene, Tom
dc.contributor.orcidextToscani, Nicola::0000-0002-2671-6870
dc.contributor.orcidextGrassi, Flavia::0000-0001-6844-8766
dc.contributor.orcidimecVande Ginste, Dries::0000-0002-0178-288X
dc.contributor.orcidimecDhaene, Tom::0000-0003-2899-4636
dc.contributor.orcidimecSpina, Domenico::0000-0003-2379-5259
dc.date.accessioned2022-01-18T09:59:05Z
dc.date.available2021-11-02T16:07:13Z
dc.date.available2022-01-18T09:59:05Z
dc.date.issued2020
dc.identifier.doi10.1109/TEMC.2020.2980790
dc.identifier.issn0018-9375
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38350
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
dc.source.beginpage2538
dc.source.endpage2546
dc.source.issue6
dc.source.journalIEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
dc.source.numberofpages9
dc.source.volume62
dc.subject.keywordsPOLYNOMIAL-CHAOS
dc.subject.keywordsVARIABILITY ANALYSIS
dc.subject.keywordsGLOBAL OPTIMIZATION
dc.subject.keywordsMULTIPORT SYSTEMS
dc.title

Machine-Learning-Based Hybrid Random-Fuzzy Uncertainty Quantification for EMC and SI Assessment

dc.typeJournal article
dspace.entity.typePublication
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