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Thickness and temperature dependent resistivity of thin copper films
Publication:
Thickness and temperature dependent resistivity of thin copper films
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Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Zhang, Wenqi
;
Brongersma, Sywert
;
Clarysse, Trudo
;
Wu, Wen
;
Vervoort, Iwan
;
Palmans, Roger
;
Hoflijk, Ilse
;
Bender, Hugo
;
Hui, W.
;
Carbonell, Laure
;
Rosseel, Erik
;
Vandervorst, Wilfried
;
Maex, Karen
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1863
since deposited on 2021-10-15
Acq. date: 2025-12-09
Citations
Metrics
Views
1863
since deposited on 2021-10-15
Acq. date: 2025-12-09
Citations