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Articles
Test structure to investigate the series resistance components of source/drain structure
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Test structure to investigate the series resistance components of source/drain structure
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Date
1997
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Biesemans, Serge
;
Kubicek, Stefan
;
De Meyer, Kristin
Journal
IEEE Electron Device Letters
Abstract
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1894
since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations
Metrics
Views
1894
since deposited on 2021-09-30
Acq. date: 2025-12-15
Citations