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Electrical defects in high-k / metal gate MOS transistors
Publication:
Electrical defects in high-k / metal gate MOS transistors
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Date
2010-10
Dissertation
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21893.pdf
3.58 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sahhaf, Sahar
Journal
Abstract
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1956
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
Citations
Metrics
Views
1956
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-15
Citations