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Electrical defects in high-k / metal gate MOS transistors

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dc.contributor.authorSahhaf, Sahar
dc.contributor.imecauthorSahhaf, Sahar
dc.contributor.thesisadvisorGroeseneken, Guido
dc.date.accessioned2021-10-18T21:08:11Z
dc.date.available2021-10-18T21:08:11Z
dc.date.embargo9999-12-31
dc.date.issued2010-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/17926
dc.title

Electrical defects in high-k / metal gate MOS transistors

dc.typePHD thesis
dspace.entity.typePublication
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