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Lateral versus vertical gate-all-around FETs for beyond 7nm technologies
Publication:
Lateral versus vertical gate-all-around FETs for beyond 7nm technologies
Date
2014
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Yakimets, Dmitry
;
Huynh Bao, Trong
;
Garcia Bardon, Marie
;
Dehan, Morin
;
Collaert, Nadine
;
Mercha, Abdelkarim
;
Tokei, Zsolt
;
Thean, Aaron
;
Verkest, Diederik
;
De Meyer, Kristin
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1904
since deposited on 2021-10-22
1
last month
Acq. date: 2025-12-08
Citations