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Impact of nitridation of SiO2 gate oxide on 1/f noise in 0.18μm CMOS

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Acq. date: 2026-09-18

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1 since deposited on 2021-10-14
Acq. date: 2026-09-18

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1898 since deposited on 2021-10-14
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Acq. date: 2026-09-18

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