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Articles
Impact of silicidation on the excess noise behaviour of MOS transistors
Publication:
Impact of silicidation on the excess noise behaviour of MOS transistors
Date
1995
Journal article
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934.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vandamme, Ewout
;
Vandamme, L.K.J.
;
Claeys, Cor
;
Simoen, Eddy
;
Schreutelkamp, Rob
Journal
Solid-State Electronics
Abstract
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2008
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations
Metrics
Views
2008
since deposited on 2021-09-29
Acq. date: 2025-10-23
Citations