Publication:

Impact of silicidation on the excess noise behaviour of MOS transistors

Date

1995
Journal article
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dc.contributor.authorVandamme, Ewout
dc.contributor.authorVandamme, L.K.J.
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.contributor.authorSchreutelkamp, Rob
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-09-29T13:20:37Z
dc.date.available2021-09-29T13:20:37Z
dc.date.embargo9999-12-31
dc.date.issued1995
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/956
dc.source.beginpage1893
dc.source.endpage1897
dc.source.issue11
dc.source.journalSolid-State Electronics
dc.source.volume38
dc.title

Impact of silicidation on the excess noise behaviour of MOS transistors

dc.typeJournal article
dspace.entity.typePublication
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