Publication:

The defect-centric perspective of device and circuit reliability – From gate oxide defects to circuits

Date

2016

Journal article

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Author(s)

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Roussel, Philippe

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Degraeve, Robin

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Linten, Dimitri

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Groeseneken, Guido

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Debacker, Peter

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Parvais, Bertrand

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Raghavan, Praveen

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Catthoor, Francky

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Journal

Solid-State Electronics

Statistics

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