Publication:

The defect-centric perspective of device and circuit reliability – From gate oxide defects to circuits

Date

2016
Journal article
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dc.contributor.authorKaczer, Ben
dc.contributor.authorFranco, Jacopo
dc.contributor.authorWeckx, Pieter
dc.contributor.authorRoussel, Philippe
dc.contributor.authorSimicic, Marko
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorBury, Erik
dc.contributor.authorCho, Moon Ju
dc.contributor.authorDegraeve, Robin
dc.contributor.authorLinten, Dimitri
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorDebacker, Peter
dc.contributor.authorParvais, Bertrand
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorCatthoor, Francky
dc.contributor.authorRzepa, Gerhard
dc.contributor.authorWaltl, Michael
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorGrasser, Tibor
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.imecauthorDebacker, Peter
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecDebacker, Peter::0000-0003-3825-5554
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.date.accessioned2021-10-23T11:37:14Z
dc.date.available2021-10-23T11:37:14Z
dc.date.issued2016
dc.identifier.issn0038-1101
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/26797
dc.identifier.urlhttp://www.sciencedirect.com/science/article/pii/S0038110116300909
dc.source.beginpage52
dc.source.endpage52
dc.source.journalSolid-State Electronics
dc.source.volume125
dc.title

The defect-centric perspective of device and circuit reliability – From gate oxide defects to circuits

dc.typeJournal article
dspace.entity.typePublication
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