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Low temperature Ge:B and GeSn:B source/drain for Ge pMOS devices: in-situ and conformal B-doping, selectivity towards oxide & nitride with no need for any post-epi activation treatment

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2015 since deposited on 2021-10-27
2last month
Acq. date: 2026-03-17

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2015 since deposited on 2021-10-27
2last month
Acq. date: 2026-03-17

Citations