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Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
Publication:
Fabrication of conductive atomic force microscope probes and their evaluation for carrier mapping
Date
2003-05
Proceedings Paper
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7549.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fouchier, Marc
;
Eyben, Pierre
;
Alvarez, David
;
Duhayon, Natasja
;
Xu, Mingwei
;
Brongersma, Sywert
;
Lisoni, Judit
;
Vandervorst, Wilfried
Journal
Abstract
Description
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Views
1992
since deposited on 2021-10-15
436
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1992
since deposited on 2021-10-15
436
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations