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Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm
Publication:
Automatic Prediction of Metal-Oxide-Semiconductor Field-Effect Transistor Threshold Voltage Using Machine Learning Algorithm
Date
2023
Journal article
https://doi.org/10.1002/aisy.202200302
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Choi, Seoyeon
;
Park, Dong Geun
;
Kim, Min Jung
;
Bang, Seain
;
Kim, Jungchun
;
Jin, Seunghee
;
Huh, Ki Seok
;
Kim, Donghyun
;
Mitard, Jerome
;
Han, Cheol E.
;
Lee, Jae Woo
Journal
ADVANCED INTELLIGENT SYSTEMS
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236
since deposited on 2023-01-14
Acq. date: 2025-10-24
Views
1376
since deposited on 2023-01-14
Acq. date: 2025-10-24
Citations
Metrics
Downloads
236
since deposited on 2023-01-14
Acq. date: 2025-10-24
Views
1376
since deposited on 2023-01-14
Acq. date: 2025-10-24
Citations