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SIMS Analysis of Thin EUV Photoresist Films
Publication:
SIMS Analysis of Thin EUV Photoresist Films
Date
2022
Journal article
https://doi.org/10.1021/acs.analchem.1c04012
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Spampinato, Valentina
;
Franquet, Alexis
;
De Simone, Danilo
;
Pollentier, Ivan
;
Pirkl, Alexander
;
Oka, Hironori
;
van der Heide, Paul
Journal
ANALYTICAL CHEMISTRY
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1851
since deposited on 2022-03-26
Acq. date: 2025-10-27
Citations
Metrics
Views
1851
since deposited on 2022-03-26
Acq. date: 2025-10-27
Citations