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NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability
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NXE:3400 OPC Process Monitoring: Model Validity vs. Process Variability
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Date
2021-02-22
Proceedings Paper
https://doi.org/10.1117/12.2583870
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2.71 MB
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xu, Dongbo
;
Rio, David
;
Gillijns, Werner
;
Delorme, Max
;
Baerts, Christina
Journal
na
Abstract
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since deposited on 2021-11-02
Acq. date: 2025-12-12
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Metrics
Downloads
134
since deposited on 2021-11-02
11
last month
1
last week
Acq. date: 2025-12-12
Views
1622
since deposited on 2021-11-02
Acq. date: 2025-12-12
Citations