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Implications of side contact depth on the Schottky barrier of 2D field-effect transistors

 
dc.contributor.authorPanarella, Luca
dc.contributor.authorSmets, Quentin
dc.contributor.authorVerreck, Devin
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorLockhart de la Rosa, Cesar Javier
dc.contributor.authorKar, Gouri Sankar
dc.contributor.authorAfanasiev, Valeri
dc.contributor.imecauthorPanarella, Luca
dc.contributor.imecauthorSmets, Quentin
dc.contributor.imecauthorVerreck, Devin
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorLockhart de la Rosa, Cesar Javier
dc.contributor.imecauthorKar, Gouri Sankar
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.orcidimecSmets, Quentin::0000-0002-2356-5915
dc.contributor.orcidimecVerreck, Devin::0000-0002-3833-5880
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecTyaginov, Stanislav::0000-0002-5348-2096
dc.contributor.orcidimecLockhart de la Rosa, Cesar Javier::0000-0002-1401-0141
dc.contributor.orcidimecAfanasiev, Valeri::0000-0001-5018-4539
dc.date.accessioned2025-02-10T12:01:26Z
dc.date.available2025-01-09T17:22:32Z
dc.date.available2025-02-10T12:01:26Z
dc.date.issued2025
dc.description.wosFundingTextThis work was done in the imec IIAP core CMOS programs and supported by The Research Foundation-Flanders (FWO: 1S72625N).
dc.identifier.doi10.1007/s10825-024-02262-6
dc.identifier.issn1569-8025
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/45055
dc.publisherSPRINGER
dc.source.beginpageArt. 32
dc.source.endpageN/A
dc.source.issue1
dc.source.journalJOURNAL OF COMPUTATIONAL ELECTRONICS
dc.source.numberofpages6
dc.source.volume24
dc.title

Implications of side contact depth on the Schottky barrier of 2D field-effect transistors

dc.typeJournal article
dspace.entity.typePublication
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