Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
iN5 EUV Single Expose Patterning Evaluation for Via Layers
Publication:
iN5 EUV Single Expose Patterning Evaluation for Via Layers
Copy permalink
Date
2021
Proceedings Paper
https://doi.org/10.1117/12.2600938
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Das, Argho
;
Blanco, Victor
;
Das, Sayantan
;
Kissoon, Nicola
;
Halder, Sandip
;
Dusa, Mircea
Journal
Proceedings of SPIE
Abstract
Description
Metrics
Views
1367
since deposited on 2022-05-22
2
last month
2
last week
Acq. date: 2025-12-10
Citations
Metrics
Views
1367
since deposited on 2022-05-22
2
last month
2
last week
Acq. date: 2025-12-10
Citations