Publication:

Oxide trapping in InGaAs-Al2O3 system and the role of sulfur in reducing the Al2O3 trap density

Date

2012

Journal article

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Author(s)

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Degraeve, Robin

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Merckling, Clement

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De Meyer, Kristin

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Journal

IEEE Electron Device Letters

Statistics

1865 since deposited on 2021-10-20

Acq. date: 2026-02-24