Skip to content
Institutional repository
Communities & Collections
Browse all items
Scientific publications
Open knowledge
Log In
imec Publications
Conference contributions
Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Publication:
Modeling transient electrical disturbances by inductive coupling for the ISO 7637-3 ICC test
Copy permalink
Date
2017
Proceedings Paper
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
37195.pdf
857.99 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Lambrecht, Niels
;
De Zutter, Daniel
;
Vande Ginste, Dries
;
Pues, Hugo
Journal
Abstract
Description
Statistics
Views
1913
since deposited on 2021-10-24
Acq. date: 2026-07-16
Citations
Statistics
Views
1913
since deposited on 2021-10-24
Acq. date: 2026-07-16
Citations