Publication:

Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility transistors

Date

2005

Journal article

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Author(s)

;

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Delhougne, Romain

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Gaubas, Eugenijus

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Roussel, Philippe

;

Verheyen, Peter

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Vandervorst, Wilfried

;

De Meyer, Kristin

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Journal

Journal of Physics: Condensed Matter

Statistics

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