Publication:
Defect analysis of strained silicon on thin strain-relaxed buffer layers for high mobility transistors
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1923 since deposited on 2021-10-16
4last month
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Acq. date: 2025-12-09
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Views
1923 since deposited on 2021-10-16
4last month
1last week
Acq. date: 2025-12-09
Citations